This longitudinal analysis investigates whether repeated periods of being Not in Education, Employment or Training (NEET) between ages 16 and 33 are associated with mental health outcomes at age 33. Prior work often treated NEET as a single status, potentially obscuring cumulative risk. The authors aimed to estimate associations for the number of NEET occasions and to explore secondary questions about age of first NEET and the type of NEET exposure.
Analyses used 3,792 participants from the Avon Longitudinal Study of Parents and Children (ALSPAC), a population-based birth cohort followed from birth to age 33. Ethical approval for the study was obtained from the ALSPAC Ethics and Law Committee and the Local Research Ethics Committees. Informed consent for use of data was obtained according to ALSPAC procedures. The authors declared no competing interests.
The primary exposure was the number of NEET occasions between ages 16 and 33. This was modelled both as a continuous count and categorically (0, 1, 2, 3+ occasions). Secondary exposures included the age at first NEET occasion (age bands reported) and the type of NEET experience among those ever NEET, categorized as single, sustained or recurrent occasions.
Outcomes measured at age 33 were:
The study estimated odds ratios (ORs) for associations between NEET exposures and each mental health outcome. Results are reported as ORs with 95% confidence intervals and p-values adjusted for false discovery rate (PFDR). Analyses compared continuous and categorical counts of NEET occasions, examined timing of first NEET, and evaluated types of NEET among those ever exposed.
Each additional NEET occasion was associated with higher odds of all assessed outcomes at age 33. Reported associations were:
When comparing categorical NEET exposure to never being NEET, three or more NEET occasions showed especially elevated odds for some outcomes. For example, three-plus occasions were associated with higher odds of depression (OR 2.68, 95% CI 1.74–4.11, PFDR = 1.76 × 10⁻⁵). Odds of lower life satisfaction (OR 5.97, 95% CI 3.93–9.05, PFDR = 4.94 × 10⁻¹⁶) and recent suicide attempt (OR 7.40, 95% CI 3.08–17.80, PFDR = 1.18 × 10⁻⁵) increased stepwise from one to three or more occasions.
Timing of first NEET occasion mattered in these secondary analyses. Associations were strongest for first NEET between ages 25 and 33 across the outcomes. However, first NEET between ages 16 and 20 was also associated with a recent suicide attempt (OR 4.49, 95% CI 2.20–9.17, PFDR = 6.51 × 10⁻⁵).
Among participants who had ever been NEET, categorizing the experience as sustained or recurrent generally showed little additional association beyond a single occasion. Exceptions were observed for lower life satisfaction (sustained/recurrent vs single: OR 2.60, 95% CI 1.68–4.02, PFDR = 0.0001) and recent suicide attempt (OR 3.16, 95% CI 1.23–8.08, PFDR = 0.042).
Findings indicate a dose-dependent relationship between repeated NEET occasions and poorer mental health at age 33 for depression, life satisfaction, and recent suicide attempt, with consistent but smaller associations for anxiety. The pattern suggests cumulative risk with repeated disengagement across adolescence and early adulthood.
The authors propose that preventing repeated NEET exposure and identifying mental health needs at the point of first NEET entry could be important targets for intervention or prevention to reduce later poorer mental health.
The manuscript reports that ALSPAC participant consent does not permit public deposition of the data in third-party public repositories. Supporting data are available from ALSPAC on request under approved proposal numbers B4792 and B5597; detailed instructions for data access are provided on the ALSPAC website. The preprint states that necessary ethical approvals were obtained and that all relevant reporting guidelines were followed.
The work declares funding from the Wellcome Trust (grant number 227063/Z/23/Z). The authors reported no competing interests. The preprint is posted on medRxiv and is made available under a CC-BY-ND 4.0 International license.